JPS56138934A - Testing device - Google Patents

Testing device

Info

Publication number
JPS56138934A
JPS56138934A JP4167280A JP4167280A JPS56138934A JP S56138934 A JPS56138934 A JP S56138934A JP 4167280 A JP4167280 A JP 4167280A JP 4167280 A JP4167280 A JP 4167280A JP S56138934 A JPS56138934 A JP S56138934A
Authority
JP
Japan
Prior art keywords
semiconductor device
terminal
station
electrode
semiconductor
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP4167280A
Other languages
English (en)
Japanese (ja)
Other versions
JPS6137776B2 (en]
Inventor
Michio Honma
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Nippon Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp, Nippon Electric Co Ltd filed Critical NEC Corp
Priority to JP4167280A priority Critical patent/JPS56138934A/ja
Publication of JPS56138934A publication Critical patent/JPS56138934A/ja
Publication of JPS6137776B2 publication Critical patent/JPS6137776B2/ja
Granted legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor

Landscapes

  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Measuring Leads Or Probes (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP4167280A 1980-03-31 1980-03-31 Testing device Granted JPS56138934A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP4167280A JPS56138934A (en) 1980-03-31 1980-03-31 Testing device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP4167280A JPS56138934A (en) 1980-03-31 1980-03-31 Testing device

Publications (2)

Publication Number Publication Date
JPS56138934A true JPS56138934A (en) 1981-10-29
JPS6137776B2 JPS6137776B2 (en]) 1986-08-26

Family

ID=12614885

Family Applications (1)

Application Number Title Priority Date Filing Date
JP4167280A Granted JPS56138934A (en) 1980-03-31 1980-03-31 Testing device

Country Status (1)

Country Link
JP (1) JPS56138934A (en])

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59500891A (ja) * 1982-05-24 1984-05-17 マイクロ　コンポ−ネント　テクノロジ−．インコ−ポレイテイド 集積回路試験装置
JPS60241716A (ja) * 1984-05-11 1985-11-30 東京電力株式会社 多端子送電系統の運転制御方法

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59500891A (ja) * 1982-05-24 1984-05-17 マイクロ　コンポ−ネント　テクノロジ−．インコ−ポレイテイド 集積回路試験装置
JPS60241716A (ja) * 1984-05-11 1985-11-30 東京電力株式会社 多端子送電系統の運転制御方法

Also Published As

Publication number Publication date
JPS6137776B2 (en]) 1986-08-26

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